Test & Measurement Wafer Level Products

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Aetrium is a leading provider of reliability test and semiconductor handling solutions. Aetrium's gravity feed test handlers are ideally suited for high volume production handling of small devices using tube input and tube output media. Aetrium's reliability test system's massively parrallel architecture can run many tests, at many different temperatures at the same time. It can support package and wafer-level testing.


Cascade Microtech offers wafer prober stations for DC/CV, RF/Microwave and failure analysis applications. Complete line of probes for parametric, optical and RF/Microwave measurements including: probe cards, membrane probes, needle probes, air coplanar probes and lightwave probes. Integrated laser systems & micro-vibrometers.


Celadon offers ultra high performance ceramic tile probing solutions. Custom broad temperature (-65 to 300 degrees C) probe cards for production, "Auto Fast" low leakage (FA level) and low capacitance characterization, WLR multi-site and burn-in.


Integrated Technology offers Probilt line of probe card analyzers up to 6016 probe channels for test, analysis, and repair of IC probe cards. Test equipment for power mosfets, diodes, bipolar transistors; high current inductive load testers, dynamic parametric test systems, power cycling semiconductor life systems.


Maury Microwave offers precision microwave instruments and components, coaxial/waveguide devices to 50/110 GHz, noise parameter measurement tools, load pull measurement system and noise calibration systems.



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